|    合作客户
|    联系我们
 
  软件开发 / ICT Program Development

Full ICT Turkey test packages for:
Agilent Medalist i3070 systems
Teradyne Teststation systems
Teradyne Spectrum88xx systems
Teradyne z18xx systems
 
    Specialties
    Over 10 years Experience in ICT Program     Development, We specialize in high end, high   complexity test solutions. This includes:
  * Limited access or reduce-to-fit challenges
  * Complex device programming with both static and unique data
  * Full testing of switching power supplies
  * Complex boundary scan chains and associated functions such as BSDL verification, BSDL correction and custom test writing.
             Boundary Scan
             Device Programming
             * Any type of device
             * Programmable Logic
             * FLASH Serial
             * Any type of programming
             * Static Data
             * Dynamic or unique data
             * Serial or Boundary Scan
  Advanced Features
* Functional test features at ICT:
* Circuit isolation and special measurements
* Reduction of operator intervention
* Maximized coverage in a limited access environment.
* Full coverage when your product exceeds the capacity of the test system.
* Dramatic reduction in your total cost of ownership.
* Expedited production ramp
* Rapid Prototype Program
* Phased Delivery
* Manufacturing support contracts
  设备维修 / Teradyne & Genrad228x Board Repair Center

 
In-Circuit Test (Teradyne TSLX128,TSLH124,TSLH124L)
* Ultra128 9004-0384
* Ultra124 9004-0385
* Ultra128L 9004-0386
* Ultra124L 9004-0387
* Ultra II-124,128L,124L
* PIO card 9004-0616
* System controller 9004-0610
* ICA card w/HV 9004-0340
* AFTM card 9004-0040
* Combo2A 9004-0225
* Combo1A 9004-0475
* DS Ref 9004-0406
* CST 2277-4712
* MTG 9004-0399
* ASTEC System Power supply
* 7V,20V,60V Alliance Power supply
 
 
租赁服务 | 测试设备 | 软件开发及维修 | 产品代理 | 联系我们
Tel:+86-21-62607120 Fax:+86-21-62442430
沪ICP备05057968号 (版权所有:上海科测电子科技有限公司)