软件开发/ICT Program Developent
Full ICT Turkey test packages for:
Agilent Medalist i3070 systems / Teradyne Teststation systems / Teradyne Spectrum88xx systems / Teradyne z18xx systems
Specialties
Over 10 years Experience in ICT Program Development, We specialize in high end, high complexity test solutions. This includes:
* Limited access or reduce-to-fit challenges
* Complex device programming with both static and unique data
* Full testing of switching power supplies
* Complex boundary scan chains and associated functions such as BSDL veriflcation, BSDL correction and custom test writing.
Boundary Scan
Device Programming
* Any type of device
* Programmable Logic
* FLASH Serial
* Any type of programming
* Static Data
* Dynamic or unique data
* Serial or Boundary Scan
Advanced Features
* Functional test features at ICT:
* Circuit isolation and special measurements
* Reduction of operator intervention
* Maximized cioverage in a limited access environment.
* Full coverage when your product exceeds the capacity of the test system.
* Dramatic reduction in your total cost of ownership.
* Expedited production ramp
* Rapid Prototype Program
* Phased Delivery
* Manufacturing support contracts
设备维修/Teradyne & Genrad228x Board Repair Center
In-Circuit Test (Teradyne TSLX128,TSLH124,TSLH124L)
* Ultral128 9004-0384
* AFTM card 9004-0040
* Ultral124 9004-0385
* Combo2A 9004-0225
* Ultral128L 9004-0386
* Combo1A 9004-0475
* Ultral124L 9004-0387
* DS Ref 9004-0406
* Ultra II-124, 128L,124L
* CST 2277-4712
* PIO card 9004-0616
* MTG 9004-0399
* System controller 9004-0610
* ASTEC System Power supply
* ICA card w/HV 9004-0340
* 7V,20V,60V Alliance Power supply